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Near-field scanning optical microscopy with nanoscale resolution from microscale probes
Near-field scanning optical microscopy with nanoscale resolution from microscale probes
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机译：近场扫描光学显微镜，具有微米级探针的纳米级分辨率
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摘要
To date, the probes of scanning near-field optical microscopes were aimed at creating electromagnetic field characteristics that are maximally localized near a nano-sized point (miniature apertures and tips, fluorescent nano-particles and molecules, dielectric and metal corners). Alternatively, the probe field, which is distributed within a larger area, can ensure the super-resolution as well. For this purpose, the field spectrum should be enriched with high spatial frequencies corresponding to small sample dimensions. As examples of such near-field probes, we propose and theoretically study the models of optical fibers with end-faces containing sharp linear edges and randomly distributed nanoparticles. These probes are more robust than the conventional probes and their fabrication is not concerned with nanoscale precision. The probes enable waveguiding of light to and from the sample with marginal losses distributing and utilizing the incident light more completely. Numerical modeling shows that, even with substantial measurement noise, the suggested probes can resolve objects that are significantly smaller than the probe size and, in certain cases, can perform better than miniature nanoprobes.
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