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Method and system for three-dimensional polarization-based confocal microscopy

机译:基于三维偏振共聚焦显微镜的方法和系统

摘要

A method and system for three-dimensional polarization-based confocal microscopy are provided in the present disclosure for analyzing the surface profile of an object. In the present disclosure, a linear-polarizing structured light formed by an optical grating is projected on the object underlying profile measurement. By means of a set of polarizers and steps of shifting the structured light, a series of images with respect to the different image-acquired location associated with the object are obtained using confocal principle. Following this, a plurality of focus indexes respectively corresponding to a plurality of inspected pixels of each image are obtained for forming a focus curve with respect to the measuring depth and obtaining a peak value associated with each depth response curve. Finally, a depth location with respect to the peak value for each depth response curve is obtained for reconstructing the surface profile of the object.
机译:在本公开中提供了用于基于三维偏振的共聚焦显微镜的方法和系统,用于分析物体的表面轮廓。在本公开中,由光栅形成的线性偏振结构光被投影在轮廓测量的基础上。通过一组偏振器和移动结构光的步骤,使用共聚焦原理获得了与物体相关的不同图像获取位置的一系列图像。随后,获得分别对应于每个图像的多个检查像素的多个聚焦指标,以形成关于测量深度的聚焦曲线并获得与每个深度响应曲线相关的峰值。最后,获得相对于每个深度响应曲线的峰值的深度位置,以重建物体的表面轮廓。

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