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Equivalent circuit model for multilayer chip capacitor, circuit constant analysis method, program, device, and circuit simulator

机译:多层片状电容器的等效电路模型,电路常数分析方法,程序,装置和电路模拟器

摘要

Improved equivalent circuits and circuit analysis using the same for a multilayer capacitor are provided. In one aspect, the equivalent series capacitance C and part of the equivalent series resistance R of a basic equivalent circuit for a multilayer chip capacitor are replaced with a capacitance CO, and capacitances Cm and C1 and the resistance Rc1 to take into consideration abnormal characteristics in electromagnetic distribution that occur at the corners and edges of the internal electrodes in the multilayer chip capacitor. In one aspect, additional circuit elements, such as resistances Rp1 and Rp2, the capacitance Cp, the inductances Lm and L1, and the resistance RL1, are provided to take into consideration the skin effects of the internal electrodes within the multilayer chip capacitor, electromagnetic proximity effects, losses and parasitic capacitance of the dielectric material, as well as parasitic inductance of the external electrodes.
机译:提供了用于多层电容器的改进的等效电路和使用该电路的电路分析。一方面,将多层芯片电容器的基本等效电路的等效串联电容C和等效串联电阻R的一部分替换为电容CO,并且电容Cm和C 1 以及电阻Rc 1 考虑到在多层片式电容器中内部电极的角部和边缘出现的电磁分布异常特性。一方面,附加的电路元件,例如电阻Rp 1 和Rp 2 ,电容Cp,电感Lm和L 1 以及电阻RL 1 的提供是考虑到多层芯片电容器内部电极的集肤效应,电磁接近效应,介电材料的损耗和寄生电容以及寄生电感的寄生电感。外部电极。

著录项

  • 公开/公告号US8527256B2

    专利类型

  • 公开/公告日2013-09-03

    原文格式PDF

  • 申请/专利权人 XIANGYING WU;

    申请/专利号US201113160394

  • 发明设计人 XIANGYING WU;

    申请日2011-06-14

  • 分类号G06G7/50;

  • 国家 US

  • 入库时间 2022-08-21 16:44:38

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