首页> 外国专利> System and Method Utilizing Time-Slice-Eradication to Eliminate the Effects of Wavelength Non-Linearities from Swept-Wavelength Testing of Optical Components for Sources with Non-Linearities

System and Method Utilizing Time-Slice-Eradication to Eliminate the Effects of Wavelength Non-Linearities from Swept-Wavelength Testing of Optical Components for Sources with Non-Linearities

机译:利用消除时间片根来消除波长非线性的影响的系统和方法,该方法和系统用于对来自非线性源的光学部件进行扫频测试

摘要

A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.
机译:一种用于在扫描范围内校正可调激光器的输出非线性的系统和方法。电磁辐射在波长范围内从可调激光源引导到测量系统,其中测量系统在波长范围内收集数据。监视在波长范围内发出的电磁辐射。确定一个或多个波长在整个波长范围内的非线性。当从可调激光源输出具有非线性的一个或多个波长时,信号被传输到测量系统以停止收集数据。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号