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The surface characteristics measurement equipment, in the contact model generation method, and

机译:接触模型生成方法中的表面特性测量设备,以及

摘要

PROBLEM TO BE SOLVED: To provide a surface property measuring device forming a three-dimensional contactor model with high accuracy, and to provide its contactor model generation method, and a program.;SOLUTION: The surface property measuring device includes: the contactor 24 whose tip can be brought into contact with a measuring object; and a control part 41 for moving the contactor 24 along the X-axis, the Y-axis and the Z-axis. The control part 41 drives the contactor 24 to trace the surface of the measuring object, and acquires a tip position of the contactor 24 as a pseudo measuring point Pi. The control part 41 calculates the three-dimensional contactor model M2 by performing copy measurement of a reference work 4 by the contactor 24. The control part 41 drives rotationally the contactor 24 around the Z-axis. The control part 41 moves the contactor 24 along the X-axis direction and the Z-axis direction at each of a plurality of rotating positions of the contactor 24 driven rotationally, performs copy measurement of the reference work 4 to acquire the pseudo measuring point Pi, and calculates the three-dimensional contactor model M2 based on the acquired pseudo measuring point Pi.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种高精度地形成三维接触器模型的表面特性测量装置,并提供其接触器模型生成方法和程序。解决方案:表面特性测量装置包括:接触器24,其尖端可以与测量对象接触;控制部41,该控制部41使接触器24沿X轴,Y轴以及Z轴移动。控制部41驱动接触器24追踪被测物的表面,取得接触器24的前端位置作为伪测量点Pi。控制部41通过利用接触器24进行基准工件4的复制测量来计算三维接触器模型M2。控制部41使接触器24绕Z轴旋转驱动。控制部41在被旋转驱动的接触器24的多个旋转位置分别使接触器24沿着X轴方向和Z轴方向移动,进行基准工件4的复制测定,取得假想测定点Pi。 ;并基于获取的伪测量点Pi计算三维接触器模型M2。; COPYRIGHT:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP5205643B2

    专利类型

  • 公开/公告日2013-06-05

    原文格式PDF

  • 申请/专利权人 株式会社ミツトヨ;

    申请/专利号JP20090009152

  • 发明设计人 加納 孝文;小島 司;門脇 聰一;

    申请日2009-01-19

  • 分类号G01B5/00;G01B5/20;

  • 国家 JP

  • 入库时间 2022-08-21 16:53:52

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