首页> 外国专利> Characteristic distribution analyzing method and apparatus, a substrate classification method and apparatus, the characteristic distribution analysis method or a program for executing a substrate classification method in a computer, and computer readable recording medium storing the program

Characteristic distribution analyzing method and apparatus, a substrate classification method and apparatus, the characteristic distribution analysis method or a program for executing a substrate classification method in a computer, and computer readable recording medium storing the program

机译:特性分布分析方法和装置,基板分类方法和装置,特性分布分析方法或用于在计算机中执行基板分类方法的程序以及存储该程序的计算机可读记录介质

摘要

PROBLEM TO BE SOLVED: To provide a characteristic distribution analysis method for hierarchically setting classification criteria for classifying substrates.;SOLUTION: A characteristic distribution analysis method includes: a step (S101) of preparing a first-layer distinction distribution group composed of a set of distinction distributions which represent distinctions of the characteristic distributions of respective substrates; a step (S102) of quantitatively evaluating the degree of similarity between the characteristic distributions of the respective substrates and the respective distinction distributions; a step (S103) of quantitatively evaluating associations among some distinction distributions, which are included in the first-layer distinction distribution group and appear simultaneously on the identical substrate, on the basis of the degree of similarity; a step (S104) of integrating some distinction distributions included in the first-layer distinction distribution group on the basis of the associations while maintaining the positions of the respective distinction distributions on the substrates so as to prepare a new distinction distribution on an assumed substrate; and a step (S105) of setting a set of the new distinction distribution and the distinction distributions in the first-layer distinction distribution group except for those subjected to the integration as a second-layer distinction distribution group.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于分层地设置用于对基板进行分类的分类标准的特征分布分析方法。解决方案:一种特征分布分析方法包括:步骤(S101),准备由一组A组成的第一层区别分布组。代表各个基板的特征分布的区别的区别分布;在步骤(S102)中,定量地评价各基板的特性分布与各差异分布之间的相似度。步骤(S103),根据相似度,对第一层差异分布组中包含的并同时出现在同一基板上的一些差异分布之间的关联进行定量评估;步骤(S104),基于关联对第一层差异分布组中包括的一些差异分布进行积分,同时在基板上保持各个差异分布的位置,以在假定的基板上准备新的差异分布; (S105);以及在第一层差异分布组中设置新的差异分布和差异分布的集合的步骤(S105),但不将其作为第二层差异分布组进行整合。;版权所有:(C)2010 ,JPO&INPIT

著录项

  • 公开/公告号JP5241302B2

    专利类型

  • 公开/公告日2013-07-17

    原文格式PDF

  • 申请/专利权人 シャープ株式会社;

    申请/专利号JP20080110221

  • 发明设计人 今井 克樹;

    申请日2008-04-21

  • 分类号H01L21/02;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-21 16:58:10

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