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Total luminous flux measurement device and the total luminous flux measurement method

机译:总光通量测定装置及总光通量测定方法

摘要

PROBLEM TO BE SOLVED: To provide a total luminous flux measuring device, capable of more accurately measuring the total luminous flux in a more compact structure, and a method for measuring total luminous flux.;SOLUTION: The total luminous flux measuring device 100 calculates the total luminous flux radiated from a target object OBJ, on the basis of a luminance that is measured by a measuring section 21, when the target object OBJ and an integrating section 10 are relatively moved so as to make substantially all of the light emission face of the target object OBJ to be exposed in the inner space of the integrating section 10. That is, the target object OBJ is arranged so as to pass through the integrating section 10, from a specimen hole 3 to a specimen hole 4, and then the luminous flux at a portion positioned in the inner space of the integrating section 10 of the target object OBJ is measured; and subsequently, the integrating section 10 is moved relative to the target object OBJ, and then the luminous flux at a portion positioned on the inner space of the integrating section 10 of the target object OBJ is measured in a manner similar to the above.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种能够以更紧凑的结构更精确地测量总光通量的总光通量测量装置,以及一种用于测量总光通量的方法。解决方案:总光通量测量装置100计算出总光通量。当目标物体OBJ和积分部10相对移动以使目标物体OBJ的基本上所有的光出射面相对移动时,基于由测量部分21测量的亮度,从目标物体OBJ辐射的总光通量。目标物体OBJ被暴露在积分部分10的内部空间中。即,目标物体OBJ被布置成从样本孔3到样本孔4穿过积分部分10,然后通过测量位于目标物体OBJ的积分部分10的内部空间中的部分处的光通量;随后,使积分部分10相对于目标物体OBJ移动,然后以与上述类似的方式测量位于目标物体OBJ的积分部分10的内部空间上的部分处的光束。版权所有:(C)2011,日本特许厅和INPIT

著录项

  • 公开/公告号JP5286571B2

    专利类型

  • 公开/公告日2013-09-11

    原文格式PDF

  • 申请/专利权人 大塚電子株式会社;

    申请/专利号JP20090124250

  • 发明设计人 大久保 和明;三島 俊介;

    申请日2009-05-22

  • 分类号G01J1/02;G01J1/00;

  • 国家 JP

  • 入库时间 2022-08-21 16:59:48

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