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SCRATCH DETECTION SENSITIVITY ADJUSTMENT METHOD, MAGNETIC PARTICLE INSPECTION METHOD, AND MAGNETIC PARTICLE INSPECTION DEVICE IN MAGNETIC PARTICLE INSPECTION
SCRATCH DETECTION SENSITIVITY ADJUSTMENT METHOD, MAGNETIC PARTICLE INSPECTION METHOD, AND MAGNETIC PARTICLE INSPECTION DEVICE IN MAGNETIC PARTICLE INSPECTION
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机译：磁粉探伤中的刮痕检测灵敏度调整方法，磁粉探伤方法和磁粉探伤装置
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摘要
PROBLEM TO BE SOLVED: To provide a scratch detection sensitivity adjustment method, a magnetic particle inspection method and a magnetic particle inspection device in a magnetic particle inspection in which time is not taken for adjustment of scratch detection sensitivity.;SOLUTION: Magnetic particles are adhered to an analyte 20 for sensitivity adjustment, which is provided with a reference defect 7 for the sensitivity adjustment, and conveyed on a continuous line 1. A part which is provided with the reference defect 7 for the sensitivity adjustment of the analyte 20 for the sensitivity adjustment is magnetized by a magnetization part 4, and irradiated with ultraviolet rays by an ultraviolet irradiation lamp 5. Then, since magnetic particle patterns corresponding to the reference defect 7 for the sensitivity adjustment is formed, a part to be inspected, on which the magnetic particle patterns are formed is picked up with an ultraviolet camera 6. An image picked up with the ultraviolet camera 6 is transmitted to an image processing part 8, and the reference defect 7 for the sensitivity adjustment is detected from the magnetic particle patterns of the image. A sensitivity adjustment part 9 adjusts magnetization intensity and/or illuminance of the part to be inspected so that detection sensitivity of the magnetic particle patterns when the reference defect 7 for the sensitivity adjustment is detected on the basis of a detection result becomes the optimal value.;COPYRIGHT: (C)2014,JPO&INPIT
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