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METHOD AND DEVICE FOR FULL-FIELD HIGH-RESOLUTION FIELD INTERFERENTIAL MICROSCOPY
METHOD AND DEVICE FOR FULL-FIELD HIGH-RESOLUTION FIELD INTERFERENTIAL MICROSCOPY
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机译：全场高分辨率干涉显微镜的方法和装置
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摘要
The invention relates to a full field interference microscopy device in incoherent light of a volume and scattering sample (106). The device comprises an interference device (100) between a reference wave (401) obtained by reflection of a wave incident on a mirror (105) of a reference arm of the interference device and an object wave (402). ) obtained by backscattering of the incident wave by a slice of the sample, an acquisition device (108) of at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase shift, a processing unit (403) of the interference signals for calculating an image of the slice of the sample. In one aspect, the interference device further comprises an optical element (404) for modifying the phase of the wavefront and the microscopy device comprises a control unit (405) of said optical element, connected to the unit. of the processing (403), the phase-modifying optical element being controlled by optimizing a statistical parameter of at least a portion of the image calculated by the processing unit.
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