首页> 外国专利> METHOD FOR MEASURING THE 3D MOVEMENT OF MICRO AND NANO SCALES USING HYBRID MICRO/NANO PIV SYSTEM, CAPABLE OF MEASURING THE 3D MOVEMENT OF A MICRO FLUIDIC ELEMENT IN MICRO SCALE AND NANO MULTI SCALE AT THE SAME TIME

METHOD FOR MEASURING THE 3D MOVEMENT OF MICRO AND NANO SCALES USING HYBRID MICRO/NANO PIV SYSTEM, CAPABLE OF MEASURING THE 3D MOVEMENT OF A MICRO FLUIDIC ELEMENT IN MICRO SCALE AND NANO MULTI SCALE AT THE SAME TIME

机译:使用混合微/纳米PIV系统测量微尺度和纳米尺度的3D运动的方法,能够同时测量微尺度和纳米多尺度的微流体元素的3D运动

摘要

PURPOSE: A method for measuring the 3D movement of micro and nano scales using hybrid micro/nano PIV system is provided to measure the 3D movement as means for studying a mass transfer by accurately calculating the 3D movement of a micro fluidic element because a target manufactured by an etching process is used for the calibration.;CONSTITUTION: A method for measuring the 3D movement of micro and nano scales using hybrid micro/nano PIV system is as follows. A defocusing PIV device and a total reflection fluorescent microscope are calibrated. The 3D movement of a micro fluidic element is measured with the defocusing PIV device in micro scale and with the total reflection fluorescent microscope in nano scale.;COPYRIGHT KIPO 2012
机译:目的:提供一种使用微米/纳米混合PIV系统测量微米和纳米尺度的3D运动的方法,以测量3D运动,作为通过精确计算微流体元件的3D运动来研究传质的手段,因为制造的目标通过蚀刻工艺进行校准。;组成:一种使用微米/纳米混合PIV混合系统测量微米级和纳米级3D运动的方法如下。散焦PIV设备和全反射荧光显微镜已校准。微流控元件的3D运动是通过散焦PIV装置进行微尺度测量,并使用全反射荧光显微镜进行纳米尺度测量。; COPYRIGHT KIPO 2012

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号