首页> 外国专利> Terahertz wave characteristic measurement method, substance detection method, measurement instrument, terahertz wave characteristic measurement device and substance detection device

Terahertz wave characteristic measurement method, substance detection method, measurement instrument, terahertz wave characteristic measurement device and substance detection device

机译:太赫兹波特性测量方法,物质检测方法,测量仪器,太赫兹波特性测量设备和物质检测设备

摘要

A terahertz wave characteristic measurement method comprises irradiating terahertz waves at a region of a target solution in which a thickness of the solution is in the range from 10 µm to 100 µm such that a propagation direction of the terahertz waves is in a thickness direction of the solution, the solution containing at least one type of target substance to be measured, and measuring at least one of a spectral characteristic and an intensity at a particular frequency or a particular wavelength of the terahertz waves that are one of transmitted through the region and reflected from the region.
机译:太赫兹波特性测量方法包括在目标溶液的区域中照射太赫兹波,在该溶液中溶液的厚度在10 µm至100 µm的范围内,以使太赫兹波的传播方向在样品的厚度方向上。溶液,该溶液包含至少一种类型的待测目标物质,并测量在通过该区域透射并反射的太赫兹波的特定频率或特定波长下的光谱特性和强度中的至少一种来自该地区。

著录项

  • 公开/公告号EP2490009A1

    专利类型

  • 公开/公告日2012-08-22

    原文格式PDF

  • 申请/专利权人 ARKRAY INC.;

    申请/专利号EP20120153909

  • 发明设计人 UCHIDA HIROHISA;KITAMURA SHIGERU;

    申请日2012-02-03

  • 分类号G01N21/35;

  • 国家 EP

  • 入库时间 2022-08-21 17:12:00

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