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METHOD FOR DETERMINATION OF TEMPERATURE DEPENDENCE OF THE WIDTH OF OPTICAL PSEUDOGAP OF SOLIDS

机译:测定固体光学伪影宽度的温度相关性的方法

摘要

The invention relates to solid state physics, in particular to the methods for investigation of parameters of the optical-absorption edge. A method for determination of temperature dependence of the width of optical pseudogap of solids includes investigation of solids. According to the invention, one carries out temperature iso-absorption investigations of the optical-absorption edge of solids at two values of absorption coefficientand, for which one obtains two temperature dependences of the width of quasi-forbidden zoneand, after that one obtains temperature dependence of the width of optical pseudogap. The method proposed makes it possible to determine quickly, reliably and effectively the width of optical quasi-gap of solids by results of iso-absorption investigations of the absorption edge, avoiding tedious spectral investigations.
机译:本发明涉及固态物理学,尤其涉及用于研究光吸收边缘的参数的方法。用于确定固体的光学拟间隙宽度的温度依赖性的方法包括对固体的研究。根据本发明,在两个吸收系数值下对固体的光吸收边缘进行温度等吸收研究,为此,获得准禁区宽度的两个温度依赖性,然后获得温度依赖性。光学伪间隙的宽度。所提出的方法使得可以通过对吸收边缘的等吸收研究的结果来快速,可靠和有效地确定固体的光学准间隙的宽度,而避免了繁琐的光谱研究。

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