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DEVICE FOR MEASURING PROPERTIES OF SCATTERERS, COLOR MEASURING DEVICE FOR SCATTERERS, COLOR MEASURING DEVICE FOR SCATTERED LIGHT OF GEMSTONES, DEVICE FOR MEASURING BRIGHTNESS OF GEMSTONES, AND DEVICE FOR MEASURING LUMINESCENCE DISTRIBUTION
DEVICE FOR MEASURING PROPERTIES OF SCATTERERS, COLOR MEASURING DEVICE FOR SCATTERERS, COLOR MEASURING DEVICE FOR SCATTERED LIGHT OF GEMSTONES, DEVICE FOR MEASURING BRIGHTNESS OF GEMSTONES, AND DEVICE FOR MEASURING LUMINESCENCE DISTRIBUTION
A device for measuring properties of scatterers which measures properties of a scatterer from a stereoscopic scattering distribution of the scatterer upon receiving an electromagnetic wave with a certain wavelength distribution is provided. In the device, a scatterer to be measured is placed on a specimen platform; the electromagnetic wave is irradiated onto the scatterer from at least either any one or more directions, or one or more continuous directions of a hypothetical spherical surface having the above-mentioned focal point as its center; scattering waves scattered by the scatterer and reflected off the paraboloidal mirror or projected onto the paraboloidal screen are imaged by the imaging means as planar imaging data; and from thus obtained imaging data, a stereoscopic distribution of the scattering waves generated by the scatterer is obtained so as to measure properties of the scatterer from the distribution result.
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