首页> 外国专利> On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability

On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability

机译：使用布尔函数的片上种子生成，用于基于LFSR重播的逻辑BIST技术，以实现低成本的现场可测试性

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摘要

This invention generates the random seed patterns using simple, low-area overhead digital circuitry on-chip. This circuit is implemented as a finite state machine whose states are the seeds as contrasted to storing the seeds in the prior art. These seeds are used to control pseudo-random pattern generation for built-in self-tests. This invention provides a large reduction in chip area in comparison with storing seeds on-chip or off-chip.

机译：本发明使用简单的，低面积的片上数字电路产生随机种子模式。该电路被实现为有限状态机，与现有技术中存储种子相比，其状态是种子。这些种子用于控制内置自检的伪随机模式生成。与将种子存储在芯片上或芯片外相比，本发明大大减少了芯片面积。

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公开/公告号US8286042B2

专利类型
公开/公告日2012-10-09

原文格式PDF
申请/专利权人 SWATHI GANGASANI;SRINIVASULU ALAMPALLY;DIVYA DIVAKARAN;RUBIN AJIT PAREKHJI;AMIT KUMAR DUTTA;SRIVATHS RAVI;
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申请/专利号US20100710081
发明设计人 DIVYA DIVAKARAN;AMIT KUMAR DUTTA;RUBIN AJIT PAREKHJI;SRINIVASULU ALAMPALLY;SWATHI GANGASANI;SRIVATHS RAVI;
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申请日2010-02-22
分类号G01R31/28;
国家 US
入库时间 2022-08-21 17:27:51

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