首页>
外国专利>
System and method to determine chromatic dispersion in short lengths of waveguides using a 3-wave interference pattern and a single-arm interferometer
System and method to determine chromatic dispersion in short lengths of waveguides using a 3-wave interference pattern and a single-arm interferometer
展开▼
机译：使用3波干涉图和单臂干涉仪确定短波长波导中色散的系统和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
The present invention relates to a system and method to determine chromatic dispersion in short lengths of waveguides using a three wave interference pattern and a single-arm interferometer Specifically the invention comprises a radiation source operable to emit radiation connected to an apparatus for separating incident and reflected waves; the apparatus for separating incident and reflected waves having an output arm adjacent to a first end of the waveguide; the apparatus for separating incident and reflected waves connected to a detector; a collimating apparatus positioned at a second end of the waveguide; and a reflecting apparatus positioned at a balanced distance from the collimating apparatus operable to reflect a test emission from the radiation source back through the collimating apparatus, the waveguide, and the apparatus for separating incident and reflected waves thereby generating an interference pattern that is recorded by the detector.
展开▼
