首页> 外国专利> METHOD AND PROGRAM FOR IDENTIFYING SURFACE SHAPE OF ULTRASONIC WAVE FLAW DETECTION TEST PIECE, APERTURE SYNTHESIS PROCESSING PROGRAM, AND PHASED ARRAY FLAW DETECTION PROGRAM

METHOD AND PROGRAM FOR IDENTIFYING SURFACE SHAPE OF ULTRASONIC WAVE FLAW DETECTION TEST PIECE, APERTURE SYNTHESIS PROCESSING PROGRAM, AND PHASED ARRAY FLAW DETECTION PROGRAM

机译:识别超声波缺陷检测零件,孔径合成处理程序和相控阵缺陷检测程序的表面形状的方法和程序

摘要

PROBLEM TO BE SOLVED: To grasp the shape of a surface of a test piece by using a reflection wave from the surface when an ultrasonic wave is made incident to the test piece.;SOLUTION: A phased array is arranged on the surface of the test piece along the surface shape of a test piece having a shape change part whose surface shape has changed, with a medium whose configurations may change intervening in between; an ultrasonic wave is projected to the test piece for each oscillator of the phased array to receive a surface echo; a reflection wave from the surface of the test piece obtained for each oscillator is detected to acquire a beam path from each oscillator to the surface of the test piece and to assume a circle having each oscillator as the center and the beam path acquired for each oscillator as the radius; a common circumscribing line of the circles having the adjacent oscillators as the respective centers is acquired; points on the common circumscribing line are two-dimensionally interpolated and identified as a test piece surface in a section where the common circumscribing line is acquired; a gap between the oscillators is determined to be a boundary of shape change in a section where a common circumscribing line cannot be acquired, and the points on the common circumscribing lines obtained in the respective sections are two-dimensionally interpolated; and the two-dimensionally interpolated point is extrapolated to identify as a surface shape of the boundary and acquire a test piece surface shape.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:当使超声波入射到测试件时,通过使用来自表面的反射波来掌握测试件表面的形状。解决方案:在测试件的表面上排列相控阵沿着具有表面形状已改变的形状改变部分的测试件的表面形状,其间插入其构型可能改变的介质。对于相控阵的每个振荡器,将超声波投射到试件上以接收表面回波。检测从每个振荡器获得的测试件表面的反射波,以获取从每个振荡器到测试件表面的光路,并假设以每个振荡器为中心的圆和每个振荡器获得的光路作为半径;获取以相邻的振荡器为各自中心的圆的共同外接线;二维外接公共外接线上的点,并在获取公共外接线上的部分中将其标识为试件表面。在不能获取公共外接线的部分中,将振荡器之间的间隙确定为形状变化的边界,并且在各个部分中获得的公共外接线上的点被二维内插;并用二维插值点进行外推以识别为边界的表面形状并获取试件的表面形状。;版权:(C)2012,JPO&INPIT

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