首页> 外国专利> HIGH SPEED STATIONARY FIELD ANALYSIS METHOD, HIGH SPEED STATIONARY FIELD ANALYSIS DEVICE, HIGH SPEED STATIONARY FIELD ANALYSIS PROGRAM AND COMPUTER-READABLE RECORDING MEDIUM WITH THE SAME PROGRAM RECORDED

HIGH SPEED STATIONARY FIELD ANALYSIS METHOD, HIGH SPEED STATIONARY FIELD ANALYSIS DEVICE, HIGH SPEED STATIONARY FIELD ANALYSIS PROGRAM AND COMPUTER-READABLE RECORDING MEDIUM WITH THE SAME PROGRAM RECORDED

机译:高速静止场分析方法,高速静止场分析装置,高速静止场分析程序和具有相同记录程序的计算机可读记录介质

摘要

PROBLEM TO BE SOLVED: To provide a high speed stationary field analysis method for much more quickly and highly accurately calculating the physical quantity of an analysis object in a stationary state in the transient analysis of a phenomenon including a time differential value.SOLUTION: The high speed stationary field analysis method for executing following processing in an electronic computer includes: calculating the physical quantity of an analysis object by transient analysis to be performed by an analysis execution module in which a differential equation including time items is made discrete (step 21); calculating the time average quantity with the prescribed time width of the calculated physical quantity of the analysis object (step S23); correcting the physical quantity of the analysis object in each time step calculated in the step S21 by using a time higher harmonics order correction formula of a time average under the consideration of the calculated time average quantity (step 24); calculating, after the physical quantity is put in a stationary state by correction, the physical quantity after the stationary state of the analysis object by transient analysis using a differential equation (step 27); and displaying the calculated physical quantity after the stationary state (step 32).
机译:要解决的问题:提供一种高速平稳场分析方法,可以在对包含时间微分值的现象进行瞬态分析时更快,更准确地计算稳态下分析对象的物理量。用于在电子计算机中执行以下处理的高速静止场分析方法,包括:通过瞬态分析来计算分析对象的物理量,该瞬变分析将由分析执行模块执行,其中将包括时间项的微分方程离散化(步骤21);利用计算出的分析对象物的物理量的规定时间宽度,计算时间平均量(步骤S23);考虑到所计算的时间平均量,通过使用时间平均的时间高次谐波阶数校正公式来校正在步骤S21中计算出的每个时间步中分析对象的物理量(步骤24);在通过校正使物理量处于静止状态之后,利用微分方程通过瞬态分析来计算分析对象的静止状态之后的物理量(步骤27);在静止状态后显示计算出的物理量(步骤32)。

著录项

  • 公开/公告号JP2012069024A

    专利类型

  • 公开/公告日2012-04-05

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20100214677

  • 发明设计人 MIYATA KENJI;

    申请日2010-09-27

  • 分类号G06F17/50;G06F19;

  • 国家 JP

  • 入库时间 2022-08-21 17:38:59

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