首页> 外国专利> The trouble information forecasting support device classified by residence, being the trouble information forecasting support device classified by residence which forecasts the component where the inside trouble

The trouble information forecasting support device classified by residence, being the trouble information forecasting support device classified by residence which forecasts the component where the inside trouble

机译:按住所分类的故障信息预测支持装置,是对内部发生故障的部位进行预测的按住所分类的故障信息预测支持装置。

摘要

PROBLEM TO BE SOLVED: To provide a prediction support device for a residence-by-residence defect having a function for pre-extracting only defect items pertinent to each residence to be predicted and outputting the defect items concurrently with output of a production drawing, in the production drawing preparation task of each residence.;SOLUTION: The prediction support device for a residence-by-residence defect includes: a DB4 for defect extraction in which defect retrieval condition information for currently held sites and members has been stored; a residence-by-residence defect information extraction part 5a for acquiring site and member data to be obtained for each site and member from residence-by-residence housing design CAD data, and for collating data included in site and member data existing for each obtained site and member with the defect retrieval condition information of each site and member stored in the DB 4 for defect extraction, and for extracting residence-by-residence defect information for the matched sites and members; a residence-by-residence defect information DB6 for storing residence-by-residence defect information extracted by the residence-by-residence defect information extraction part 5a; and a residence-by-residence defect information output means for outputting residence-by-residence defect information stored in the residence-by-residence defect information DB6.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种用于按居住地居住的缺陷的预测支持装置,该功能具有以下功能:仅预先提取与要预测的每个居住地有关的缺陷项目,并与生产图纸的输出同时输出缺陷项目。解决方案:用于按居住地居住的缺陷的预测支持设备包括:用于缺陷提取的DB4,其中已存储了当前持有的场所和成员的缺陷检索条件信息。分居缺陷信息提取部分5a,用于从分居住房设计CAD数据中获取要为每个场所和成员获得的场所和成员数据,并核对包括在每个获得的场所和成员数据中的数据站点和成员,具有存储在DB 4中的每个站点和成员的缺陷检索条件信息,用于缺陷提取以及用于提取匹配的站点和成员的按居所的缺陷信息;居住缺陷信息DB6,用于存储由居住缺陷信息提取部5a提取出的居住缺陷信息。居住权缺陷信息输出装置,用于输出存储在居住权缺陷信息DB6中的居住权缺陷信息。;版权:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP4932763B2

    专利类型

  • 公开/公告日2012-05-16

    原文格式PDF

  • 申请/专利权人 旭化成ホームズ株式会社;

    申请/专利号JP20080050526

  • 发明设计人 宮部 利夫;

    申请日2008-02-29

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 17:39:42

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