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Concept for non-scanning fraunhofer-and/or fresnel regime optical microscopy and spatially resolved spectroscopy - e.g. utilizing FTIR-technique - in special
Concept for non-scanning fraunhofer-and/or fresnel regime optical microscopy and spatially resolved spectroscopy - e.g. utilizing FTIR-technique - in special
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机译：非扫描弗劳恩霍夫和/或菲涅耳状态光学显微镜和空间分辨光谱学的概念-例如利用FTIR技术-特别
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摘要
Highly spatially resolved optical microscopy or spectroscopy of a sample 1.8 is performed at rapid imaging rates beyond the diffraction limit (4, figure 1b). It is computer-assisted by reconstruction of the originally formed diffraction image by back-transforming computer software after diffraction image data have been directly recorded by a large array 3 of very small pixel sensors to quantitatively measure the light intensity profile.
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