首页> 外国专利> Polynuclear integrated microprocessor circuitry for, e.g. vehicle domain computer, has tester to perform time-integral checking of specific components of auxiliary processor structure to and gradually expand checking of other components

Polynuclear integrated microprocessor circuitry for, e.g. vehicle domain computer, has tester to perform time-integral checking of specific components of auxiliary processor structure to and gradually expand checking of other components

机译：多核集成微处理器电路，例如车辆领域的计算机，具有测试器以对辅助处理器结构的特定组件进行时间积分检查，并逐步扩展对其他组件的检查

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摘要

The circuitry has two kernel processors (1,2) which are assigned to a master processor structure (3). Another kernel processor (4) is assigned to an auxiliary processor structure (5). A tester connected to master processor structure, checks the proper functioning of auxiliary processor structure. The tester is arranged for performing time-integral checking of specific components of auxiliary processor structure. The time-integral checking is gradually expanded to other components of auxiliary processor structure. An independent claim is included for testing method of proper functioning of microprocessor circuitry.

机译：该电路具有两个内核处理器（1,2），它们被分配给一个主处理器结构（3）。另一个内核处理器（4）被分配给辅助处理器结构（5）。连接到主处理器结构的测试仪将检查辅助处理器结构的正常功能。该测试器被安排用于执行辅助处理器结构的特定组件的时间积分检查。时间积分检查逐渐扩展到辅助处理器结构的其他组件。包括独立权利要求，用于测试微处理器电路的正常功能的方法。

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公开/公告号DE102011007467A1

专利类型
公开/公告日2011-11-03

原文格式PDF
申请/专利权人 CONTINENTAL TEVES AG & CO. OHG;
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申请/专利号DE20111007467
发明设计人 ZIMMERSCHITT-HALBIG PETER;SCHADE KAI;
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申请日2011-04-15
分类号G06F11/30;G06F11/16;G06F13/00;B60R16/02;
国家 DE
入库时间 2022-08-21 17:47:08

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