首页>
外国专利>
Method for measurement of thickness of stack of leaf-shaped material i.e. paper sheet, for shredding in shredder, involves performing thickness measurement away from channel and by device for measurement of thickness of stack
Method for measurement of thickness of stack of leaf-shaped material i.e. paper sheet, for shredding in shredder, involves performing thickness measurement away from channel and by device for measurement of thickness of stack
The method involves carrying out measurement of thickness of a stack of leaf-shaped material i.e. paper sheet, outside of a material feed channel (5) provided in a housing (2) of a shredder (1). The measurement of the thickness of the stack is performed away from the channel in a region close to an upper edge of the housing and by a device for measurement of the thickness of the stack. The device is arranged at or in an upper part (4) of the housing. The upper edge of the housing is turned toward an operator. The measurement of the thickness of the stack is linear over whole stack width. Independent claims are also included for the following: (1) a shredder comprising a cutting platform (2) a device for measurement of thickness of material stacks.
展开▼
