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SYSTEM FOR TESTING ACCELERATED LIFETIME OF ELECTRIC DEVICE
SYSTEM FOR TESTING ACCELERATED LIFETIME OF ELECTRIC DEVICE
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机译：电气寿命加速测试系统
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摘要
PURPOSE: A system for testing an accelerated lifetime of an electric device is provided to reduce a time necessary for an accelerated lifetime test by performing an accelerated lifetime test once. CONSTITUTION: A temperature chamber includes one or more test racks in which a plurality of electronic component cards are loaded. Each of the electronic component cards includes a plurality of electronic component chips. A power supply unit generates source power to be supplied to the temperature chamber. A power distribution unit distributes the source power to the electronic component cards. A channel group includes one or more channel group units including a plurality of channels. A current measurement unit measures an insulating resistance value. A control unit controls each of the components.
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