首页> 外国专利> BIREFRINGENCE MEASURING METHOD AND APPARATUS USING OFF-AXIS DIGITAL HOLOGRAPHY

BIREFRINGENCE MEASURING METHOD AND APPARATUS USING OFF-AXIS DIGITAL HOLOGRAPHY

机译:偏轴数字全息双折射测量方法及装置

摘要

The present invention relates to a birefringence measurement apparatus and method using a digital holography for Off-axis method. And a light source for generating a linearly polarized beam having a polarization direction tilted 45 birefringence measurement apparatus, for each vertical polarization and horizontal polarization direction in accordance with the present invention; And the first beam splitter to divide the output of the linear polarized beam to the measurement beam path and the reference beam path from the light source; Off-axis method is inclined with respect to the reference beam path and a reference mirror disposed so as to be applicable; And a second beam splitter for the linearly polarized beam is emitted from the first light divider directing the linearly polarized beam that is emitted from the first light dividing mirror so that the reflection by the reference mirror to the reference direction; And a reflecting mirror for reflecting the linearly polarized light beam emitted from the first beam splitter, the linearly polarized light beam is emitted from the first beam splitter to transmit the measurement object with the measurement object orientation; 3 for the linear polarization beam is output is formed by dividing a measurement beam reflected from the reference mirror for the reference beam is transmitted through the linearly polarized beam and the measurement object is formed by the first imaging unit and the second imaging section direction and a beam splitter; And a vertical polarizer for outputting the first image pickup portion is disposed between the first imaging unit and the third beam splitter to pass through the vertical polarization component of the interference light formed by the interference between the measuring beam and the reference beam; The first imaging unit and is disposed between the third beam splitter for outputting the horizontal line polarizing plate and the second image pickup portion is passed through the horizontal polarization component of the interference light; The digital holographic analysis method of the Off-axis method for each of the horizontal polarization component taken by the second imaging section and the vertical polarization component which is picked up by the first image pickup unit is applied to the vertical polarization for the polarization component perpendicular phase information and phase information of the horizontal polarization and the horizontal polarization component is extracted, and the vertical polarization and phase information; and a control unit for calculating the magnitude of the double refraction of the measurement object on the basis of the horizontal polarization phase information .
机译:双折射测量设备和方法技术领域本发明涉及使用数字全息用于离轴方法的双折射测量设备和方法。根据本发明的光源,用于产生具有垂直于水平偏振方向和水平偏振方向的偏振方向倾斜的线偏振光束的双折射测量装置45。第一分束器将线性偏振光束的输出分到光源的测量光束路径和参考光束路径;偏轴法相对于参考光路倾斜,并设置有可适用的参考镜;并且,从第一分光器射出用于第二偏振分束器的第二分束器,该第二分束器引导从第一分光镜发射的线性偏振的射束,使得参考镜的反射向参考方向;反射镜,用于反射从第一分束器射出的线偏振光束,从第一分束器射出线偏振光束,使被测物朝向被测物取向。通过分割从参考镜反射的测量光束而形成图3的用于线性偏振光束的输出,用于使参考光束透射通过线性偏振光束,并且由第一成像单元和第二成像部的方向和分束器;并且在第一成像单元和第三分束器之间设置用于输出第一图像拾取部分的垂直偏振器,以使由测量光束和参考光束之间的干涉形成的干涉光的垂直偏振分量穿过;第一成像单元设置在第三光束分离器和第二图像拾取部分之间,该第三光束分离器用于输出水平线偏振片,第二图像拾取部分穿过干涉光的水平偏振分量。对于由第二成像部分拍摄的每个水平偏振分量和由第一图像拾取单元拾取的垂直偏振分量的偏轴方法的数字全息分析方法被应用于垂直偏振分量的垂直偏振。提取水平极化和水平极化分量的相位信息和相位信息,并得到垂直极化和相位信息;控制单元根据水平偏振相位信息计算被测物的二次折射大小。

著录项

  • 公开/公告号KR101005161B1

    专利类型

  • 公开/公告日2011-01-04

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20090006775

  • 发明设计人 유영웅;최영진;김대석;

    申请日2009-01-29

  • 分类号G01N21/23;G01J4/00;G01B11/25;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:45

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