首页> 外国专利> RETARGET PROCESS MODELING METHOD, AND A METHOD FOR FABRICATING MASK USING THE SAME MODELING METHOD, CAPABLE OF IMPROVING PRODUCTIVITY BY MANUFACTURING A MASK IN A TARGET PATTERN

RETARGET PROCESS MODELING METHOD, AND A METHOD FOR FABRICATING MASK USING THE SAME MODELING METHOD, CAPABLE OF IMPROVING PRODUCTIVITY BY MANUFACTURING A MASK IN A TARGET PATTERN

机译:重定位过程建模方法以及使用相同建模方法制造面具的方法,能够通过在目标图案中制造面具来提高生产率

摘要

PURPOSE: A retarget process modeling method, and a method for fabricating mask using the same modeling method are provided to generate improved process model reflecting real PR flow rate by performing a retarget process modeling in consideration of the density of an SRAF pattern interfering PR flow rate.;CONSTITUTION: In a retarget process modeling method, and a method for fabricating mask using the same modeling method, a predication data of a desk layout using a conventional process model(S110). Corresponding features which is interfered by PR flow are secured by using bias data(S120). A kernel including a PR flow kernel considering an SRAF(Sub Resolution Assist Feature) is generated(S130). An improved process model is obtained by applying an un-calibrated model to measured data and fitting(S140).;COPYRIGHT KIPO 2011
机译:目的:提供一种重定位过程建模方法,以及使用相同建模方法制造掩模的方法,以通过考虑SRAF模式的密度干扰PR流速的方式执行重定位过程建模来生成反映实际PR流速的改进的过程模型。组成:在重定位过程建模方法和使用相同建模方法制造掩模的方法中,使用常规过程模型的办公桌布局的预测数据(S110)。通过使用偏置数据来确保被PR流动干扰的相应特征(S120)。生成包括考虑了SRAF(子分辨率辅助特征)的PR流内核的内核(S130)。通过将未经校准的模型应用于测量数据并进行拟合,可以获得改进的过程模型(S140)。; COPYRIGHT KIPO 2011

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