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Method and device for measuring surface potential distribution, method and device for measuring insulation resistance, electrostatic latent image measurement device, and charging device

机译:测量表面电势分布的方法和装置,测量绝缘电阻的方法和装置,静电潜像测量装置以及充电装置

摘要

A surface potential distribution measurement method and device including setting a sample having a surface with a surface potential distribution in a sample installation unit wherein both an electric field intensity formed on the sample surface and a potential bias component of the sample are variable, and scanning the sample surface in a one-dimensional or two-dimensional manner by irradiating a charged particle beam to the sample. The method also includes obtaining a detection signal from charged particles generated by the scanning, to measure the surface potential distribution of the sample by varying the electric field intensity and the potential bias component in order to control a quantity of the detection signal obtained from the charged particles.
机译:一种表面电势分布测量方法和装置,包括:将样品表面设置成具有表面电势分布的表面,其中所述样品安装单元中形成在所述样品表面上的电场强度和所述样品的电势偏置分量均可变,并扫描所述样品。通过向样品照射带电粒子束,以一维或二维方式对样品表面进行处理。该方法还包括从通过扫描产生的带电粒子获得检测信号,以通过改变电场强度和电势偏置分量来测量样品的表面电势分布,以便控制从带电获得的检测信号的量。粒子。

著录项

  • 公开/公告号US7869725B2

    专利类型

  • 公开/公告日2011-01-11

    原文格式PDF

  • 申请/专利权人 HIROYUKI SUHARA;

    申请/专利号US20100788989

  • 发明设计人 HIROYUKI SUHARA;

    申请日2010-05-27

  • 分类号G03G15/00;

  • 国家 US

  • 入库时间 2022-08-21 18:09:30

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