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SMEAR CORRECTION METHOD OF CCD TYPE SOLID-STATE IMAGING ELEMENT, AND IMAGING DEVICE

机译:CCD型固态成像元件的修整方法及成像装置

摘要

PROBLEM TO BE SOLVED: To reduce the fixed pattern noise of vertical stripes by smear correction in a CCD type CCD solid-state imaging element.;SOLUTION: In this smear correction method of a CCD type solid-state imaging element in which a picked-up image signal read from each of a plurality of pixels mounted with the same color filter is transferred and outputted through two adjacent vertical charge transfer paths, a value obtained by averaging smear signals from an optical black part transferred by the two vertical charge transfer paths is subjected to smear correction as a smear component 14 of the picked-up image signal transferred by the vertical charge transfer paths.;COPYRIGHT: (C)2011,JPO&INPIT
机译:要解决的问题:通过在CCD型CCD固态成像元件中进行拖尾校正来减少垂直条纹的固定图案噪声。;解决方案:在这种CCD型固态成像元件的拖尾校正方法中,从安装有相同滤色器的多个像素中的每个像素读取的向上图像信号通过两个相邻的垂直电荷传输路径进行传输和输出,通过对来自通过两个垂直电荷传输路径传输的光学黑色部分的拖影信号进行平均获得的值是作为垂直电荷传输路径传输的摄像图像信号的拖尾分量14进行了拖尾校正。版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2011101170A

    专利类型

  • 公开/公告日2011-05-19

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORP;

    申请/专利号JP20090253997

  • 发明设计人 FUKUDA SHINYA;

    申请日2009-11-05

  • 分类号H04N9/07;

  • 国家 JP

  • 入库时间 2022-08-21 18:23:52

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