首页>
外国专利>
Probe for infrared spectroscopy application, has optical element with contact surface on outer circumference, where layer is provided at circumference and optical element is held by pressing element transverse to axis of probe head
Probe for infrared spectroscopy application, has optical element with contact surface on outer circumference, where layer is provided at circumference and optical element is held by pressing element transverse to axis of probe head
The probe has an optical element (3) with a circular contact surface (3.1) on an outer circumference. A thin-walled intermediate layer (4) made of flexible and/or ductile material e.g. gold or Teflon(RTM: PTFE), is provided at the circumference. The optical element is held by a radial pressing element (5) transverse to an axis of a tubular probe head (1). A ring attachment piece (1.1) is formed at the head on the circumference and pressed by the pressing element radially inward against the layer. The optical element is formed as a conical silicon crystal or diamond.
展开▼
