首页> 外国专利> Method for determining mapping relation of real space to image space at X-ray-C-arc system, involves defining mapping relation as mapping relation computed on basis of selected assignment

Method for determining mapping relation of real space to image space at X-ray-C-arc system, involves defining mapping relation as mapping relation computed on basis of selected assignment

机译:在x射线-c-arc系统中确定真实空间与图像空间的映射关系的方法,包括将映射关系定义为基于所选分配计算的映射关系

摘要

The method involves inserting a calibration object with marker elements into an X-ray-C-arc system, and obtaining an x-ray image of the calibration object with the X-ray-C-arc-system. Structures in the x-ray image are assigned to marker elements. A selection of a portion of the assignment is defined, and a mapping relation is defined as mapping relation computed on the basis of the selected assignment, where defining of the selection and/or the mapping relation for the selection takes place according to a pre-determined criterion.
机译:该方法包括将带有标记元素的校准对象插入X射线C弧系统,并使用X射线C弧系统获得校准对象的X射线图像。 X射线图像中的结构被分配给标记元素。定义分配的一部分的选择,并且将映射关系定义为基于所选分配而计算的映射关系,其中,选择的定义和/或用于选择的映射关系根据预先确定的标准。

著录项

  • 公开/公告号DE102008035656A1

    专利类型

  • 公开/公告日2010-03-18

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE20081035656

  • 发明设计人 VOGT FLORIAN;

    申请日2008-07-31

  • 分类号G01N23/04;G01N23/06;A61B6;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:53

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号