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Scattering parameters measuring method for device under test, involves determining scattering parameters of device under test, determining differences between measured wave frequencies and executing correction calculation
Scattering parameters measuring method for device under test, involves determining scattering parameters of device under test, determining differences between measured wave frequencies and executing correction calculation
The method involves feeding measuring signals into respective measuring gates (40, 41). Wave frequencies (a1) of moving-away waves and wave frequencies (b1, b2) of moving-back waves are measured. The corrected wave frequencies are determined based on a correction calculation. The scattering parameters of a device under test (42) are determined from the determined corrected wave frequencies. The differences between the measured wave frequencies are determined before correction calculation. The correction calculation is executed based on the determined differences. An independent claim is also included for a scattering parameters measuring device comprising a transmission unit.
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