首页> 外国专利> Semiconductor component for testing error correction-functionality during accessing dynamic RAM in e.g. notebook, has bit error circuit including modifying circuit as part of modifying unit, which controllably modifies access data

Semiconductor component for testing error correction-functionality during accessing dynamic RAM in e.g. notebook, has bit error circuit including modifying circuit as part of modifying unit, which controllably modifies access data

机译：用于在访问动态RAM期间测试错误校正功能的半导体组件笔记本电脑，具有误码电路，包括修改电路，作为修改单元的一部分，可控地修改访问数据

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摘要

The semiconductor component has a bit error circuit producing a bit error. The bit error circuit includes a modifying circuit as a part of a modifying unit e.g. XOR-gate, which controllably modifies access data during accessing a memory component. A frequency of controllable modification is adjustable for defining an error rate performance. A memory address in the semiconductor component is adjusted and is provided for the modified access data. An address comparing unit tests a correlation of a quasi-random error address with memory row and column addresses of the access data. An independent claim is also included for a method for testing an error correction-functionality during accessing a memory component.

机译：半导体组件具有产生误码的误码电路。误码电路包括一个修改电路，作为修改单元的一部分，例如： XOR门，在访问内存组件期间可控地修改访问数据。可控制修改的频率是可调的，以定义错误率性能。调整半导体组件中的存储地址，并将其提供给修改后的访问数据。地址比较单元测试准随机错误地址与访问数据的存储器行和列地址的相关性。还包括一种用于在访问存储器组件期间测试错误校正功能的方法的独立权利要求。

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公开/公告号DE102008026568A1

专利类型
公开/公告日2010-04-08

原文格式PDF
申请/专利权人 QIMONDA AG;
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申请/专利号DE20081026568
发明设计人 PERNER MARTIN;
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申请日2008-06-03
分类号G11C29/42;G11C29/12;
国家 DE
入库时间 2022-08-21 18:28:58

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