首页> 外国专利> WASHING SOLUTION FOR A CHALCOGENIDE COMPOUND CONTAINING AN AQUEOUS SOLUTION INCLUDING TRIFLUOROACETIC ACID, ISOPROPYL ALCOHOL, AND DEIONIZED WATER

WASHING SOLUTION FOR A CHALCOGENIDE COMPOUND CONTAINING AN AQUEOUS SOLUTION INCLUDING TRIFLUOROACETIC ACID, ISOPROPYL ALCOHOL, AND DEIONIZED WATER

机译:含三氟乙酸,异丙醇和去离子水的含硫化合物的洗涤溶液

摘要

PURPOSE: A washing solution for a chalcogenide compound is provided to prevent the loss of a phase change material layer during a washing process after etching, and to use the washing solution for washing a semiconductor device.;CONSTITUTION: A washing solution for washing a semiconductor device is used for a washing process after etching of a phase change material layer formed with a chalcogenide compound. The washing solution includes an aqueous solution consisting of trifluoroacetic acid, isopropyl alcohol, and deionized water. The mixture ratio of the trifluoroacetic acid, the isopropyl alcohol, and the deionized water is 3:5:2.;COPYRIGHT KIPO 2011
机译:目的:提供一种硫族化物化合物的清洗液,以防止蚀刻后的清洗过程中相变材料层的损失,并使用该清洗液清洗半导体器件。组成:清洗半导体的清洗液在蚀刻由硫族化物化合物形成的相变材料层之后,该装置用于洗涤工艺。洗涤溶液包括由三氟乙酸,异丙醇和去离子水组成的水溶液。三氟乙酸,异丙醇和去离子水的混合比为3:5:2。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100113720A

    专利类型

  • 公开/公告日2010-10-22

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090032169

  • 发明设计人 JUNG JAE CHANG;

    申请日2009-04-14

  • 分类号G03F7/32;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:42

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