Disclosed are an optical characteristic measuring device, an optical characteristic measuring method, and a dual spectral emissivity factor measuring method, wherein different parts in a measurement region are illuminated by illuminating light beams having spectrum distributions different for the respective parts, and a predetermined optical characteristic of a sample is determined on the basis of information obtained by the illumination and relating to light emitted from each part. Therefore, the optical characteristics of a fluorescent sample and optical characteristics, such as dual spectral emissivity factor can be measured in a short time.
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