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METHODS AND SYSTEM FOR EXTERNAL CALIBRATION AND CORRECTION OF THE DIFFRACTION ANGLE THETA OF AN X-RAY DIFFRACTION IMAGING SYSTEM USING A STANDARD REFERENCE MATERIAL LIKE POLYETHYLENE, SODIUM CHLORIDE OR ALUMINIUM
METHODS AND SYSTEM FOR EXTERNAL CALIBRATION AND CORRECTION OF THE DIFFRACTION ANGLE THETA OF AN X-RAY DIFFRACTION IMAGING SYSTEM USING A STANDARD REFERENCE MATERIAL LIKE POLYETHYLENE, SODIUM CHLORIDE OR ALUMINIUM
A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle.
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