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Method for analysing the effects of exterior influences on electric switches and analytic device

机译:分析外部影响对电气开关影响的方法和分析装置

摘要

Method for impact analysis of external effects on electrical circuits, involves regulating electrical circuit in testing room and generating selected effect, where temporal method of one parameter, involves measuring one value : The method involves regulating an electrical circuit in a testing room and generating a selected effect. A temporal method of one parameter, involves measuring one value from multiple points of time for performance of the electrical circuit. The temporal method of another parameter, involves measuring another value from multiple points of time for an external effect. The temporal method of the former parameter in a two dimensional diagram, is released, where a temporal method is applied as a time function. A diagram background (22), is determined by the later parameter.
机译:外部影响对电路的影响分析的方法,涉及调节测试室中的电路并生成选定的效果,其中一个参数的时间方法涉及测量一个值:该方法涉及调节测试室中的电路并生成选定的值影响。一种参数的时间方法,涉及从多个时间点测量一个值以实现电路性能。另一个参数的时间方法涉及从多个时间点测量另一个值以产生外部影响。释放了二维图中前一个参数的时间方法,其中将时间方法用作时间函数。图表背景(22)由后面的参数确定。

著录项

  • 公开/公告号EP1890166B1

    专利类型

  • 公开/公告日2010-07-07

    原文格式PDF

  • 申请/专利权人 ROHDE & SCHWARZ GMBH & CO. KG;

    申请/专利号EP20070014020

  • 发明设计人 REICH FRIEDRICH;

    申请日2007-07-17

  • 分类号G01R31/28;

  • 国家 EP

  • 入库时间 2022-08-21 18:38:40

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