首页> 外国专利> Identification methods for polymeric films include white light interferometry for measuring the thickness of thin films, including an identification method for objects containing bipolar thin films, the number of detections, and the use of interferometry. Torture.

Identification methods for polymeric films include white light interferometry for measuring the thickness of thin films, including an identification method for objects containing bipolar thin films, the number of detections, and the use of interferometry. Torture.

机译：用于聚合物膜的识别方法包括用于测量薄膜厚度的白光干涉测量法，包括用于包含双极性薄膜的物体的识别方法，检测次数以及干涉测量法的使用。酷刑。

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摘要

Authentication method of a Polymer Film comprising Measuring the thickness of a layer within the same using White Light Interferometry.Method of Authentication of an object comprising a Polymer film; quantity of Detection; and use of measuring Interferometry.

机译：聚合物膜的认证方法，包括使用白光干涉法测量其内的层的厚度。检测数量;和使用干涉测量法。

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公开/公告号CL2009001013A1

专利类型
公开/公告日2010-01-04

原文格式PDF
申请/专利权人 INNOVIA FILMS LIMITED;
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申请/专利号CL20090001013
发明设计人 STEWART ROBERT LAIRD.;
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申请日2009-04-28
分类号G01N21/23;
国家 CL
入库时间 2022-08-21 18:47:12

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