首页> 外国专利> In-situ monitoring and method to determine accumulated printed wiring board thermal and/or vibration stress fatigue using a mirrored monitor chip and continuity circuit

In-situ monitoring and method to determine accumulated printed wiring board thermal and/or vibration stress fatigue using a mirrored monitor chip and continuity circuit

机译:使用镜像监控器芯片和连续性电路进行现场监控以及确定累积的印刷线路板热和/或振动应力疲劳的方法

摘要

A monitoring system includes a monitor chip or chips soldered to a printed wiring board. By mirroring a function IC chip interface with the monitor chip, the consumed and remaining thermal/and or vibration-fatigue life of the function IC chip based on the life-environment actually experienced through monitoring of the monitor chip is readily determined. The monitor chip includes monitoring interconnections and/or circuitry which determines the number and/or location of failed-open solder terminations of the monitor chip.
机译:监视系统包括监视芯片或焊接到印刷线路板上的芯片。通过将功能IC芯片接口与监视芯片进行镜像,可以很容易地确定功能IC芯片的消耗和剩余的热/和/或振动疲劳寿命,该寿命基于通过监视监视芯片实际经历的寿命环境而定。监控器芯片包括监控互连和/或电路,该互连和/或电路确定监控器芯片的失效打开的焊料端子的数量和/或位置。

著录项

  • 公开/公告号US7648847B2

    专利类型

  • 公开/公告日2010-01-19

    原文格式PDF

  • 申请/专利权人 TED R. SCHNETKER;

    申请/专利号US20060474540

  • 发明设计人 TED R. SCHNETKER;

    申请日2006-06-26

  • 分类号H01L21/00;

  • 国家 US

  • 入库时间 2022-08-21 18:49:47

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