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Of tire uniformity measurement method and tire uniformity measurement device used to it

机译:轮胎均匀度测定方法及所使用的轮胎均匀度测定装置

摘要

PROBLEM TO BE SOLVED: To provide a tire uniformity measuring method and a measuring apparatus capable of excluding errors and highly precisely identifying AVV characteristic waveforms.;SOLUTION: F is a tire axis measurement waveform within the tire phase range Σ of one circumference of a tire, and K is a drum axis measurement waveform within a drum phase range Ψ corresponding to the tire phase range Σ as a contact range between circumferential surfaces. A tire AVV characteristic waveform X is identified by substituting the waveforms F and K; a tire axis AVV error waveform G which is previously identified and which appears independently of tires; and a drum axis AVV error waveform H in the expression (1) (wherein R is a tire/drum radius ratio (the ratio of the rolling radius of the tire to the radius of a loading drum)).;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种能够消除误差并高精度地识别AVV特征波形的轮胎均匀性测量方法和测量装置。解决方案:F是轮胎相位范围&Sigma内的轮胎轴线测量波形;其中,K为轮胎的鼓周相位范围&Psi内的鼓轴测量波形。对应于轮胎相位范围Σ作为圆周表面之间的接触范围。通过代入波形F和K来识别轮胎AVV特性波形X;轮胎轴线AVV误差波形G,其先前被识别并且独立于轮胎而出现;式(1)中的鼓轴AVV误差波形H(式中,R是轮胎鼓鼓半径比(轮胎的滚动半径与装载鼓的半径之比))。COPYRIGHT:(C) 2006年,日本特许厅

著录项

  • 公开/公告号JP4528083B2

    专利类型

  • 公开/公告日2010-08-18

    原文格式PDF

  • 申请/专利权人 株式会社ブリヂストン;

    申请/专利号JP20040292633

  • 发明设计人 小船井 克夫;

    申请日2004-10-05

  • 分类号G01M1/16;B60C25/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:00:56

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