首页> 外国专利> FRONT AND REAR SURFACE MEASURING PROBE, FRONT AND REAR SURFACE MEASURING INSTRUMENT, AND METHOD FOR MEASURING FRONT AND REAR SURFACE

FRONT AND REAR SURFACE MEASURING PROBE, FRONT AND REAR SURFACE MEASURING INSTRUMENT, AND METHOD FOR MEASURING FRONT AND REAR SURFACE

机译:前表面和后表面测量探头,前表面和后表面测量仪器以及前表面和后表面的测量方法

摘要

PROBLEM TO BE SOLVED: To provide a front and rear surface measuring probe, a front and rear surface measuring instrument, and a method for measuring front and rear surfaces, for highly accurately measuring the front and rear surfaces of a measuring object by one probe independently of the shapes of the front and rear surfaces of the measuring object.;SOLUTION: This front and rear surface measuring probe includes a probe body 10, a detection shaft 20 comprising contacts 22 and 23 at both ends thereof, a guide mechanism 30 supporting the detection shaft 20 so as to allow it to move axially of the detection shaft 20 relative to the probe body 10, a drive mechanism 40 for axially moving the detection shaft 20, and a position detection means 50 for detecting a moving position of the detection shaft 20 coaxially with the detection shaft 20.;COPYRIGHT: (C)2010,JPO&INPIT
机译:要解决的问题:提供一种前后表面测量探头,一种前后表面测量仪器以及一种测量前后表面的方法,以通过一个探头独立地高精度地测量被测物体的前后表面。解决方案:该前,后表面测量探头包括探头主体10,检测轴20(两端均包含触点22和23),引导机构30,用于支撑测量对象的前表面和后表面的形状。检测轴20以使其相对于探头主体10沿轴向移动,检测机构20使驱动轴40沿轴向移动,驱动机构40使检测轴20沿轴向移动,位置检测单元50检测检测轴20的移动位置。 20与检测轴20同轴;;版权:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010122138A

    专利类型

  • 公开/公告日2010-06-03

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20080297716

  • 发明设计人 YAMAGATA MASAYOSHI;NEMOTO KENTARO;

    申请日2008-11-21

  • 分类号G01B5/012;G01B21/00;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:12

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