首页> 外国专利> FLAW INSPECTION APPARATUS FOR METAL WIRE-LIKE MATERIAL, AND CONTINUOUS PROCESSING APPARATUS FOR METAL WIRE-LIKE MATERIAL USING SAME APPARATUS

FLAW INSPECTION APPARATUS FOR METAL WIRE-LIKE MATERIAL, AND CONTINUOUS PROCESSING APPARATUS FOR METAL WIRE-LIKE MATERIAL USING SAME APPARATUS

机译:金属线状材料的缺陷检测装置,以及使用相同装置的金属线状材料的连续加工装置

摘要

PROBLEM TO BE SOLVED: To provide a flaw inspection apparatus for metal wire-like material and a continuous processing apparatus comprising an inspection means capable of being adopted without limitation on property and type of objective wire material and of inspecting with low cost a wire material moving at high speeds.;SOLUTION: The flaw inspection apparatus for metal wire-like material and the continuous processing apparatus using the flaw inspection apparatus are provided, wherein a circuit is formed by being made cordless in a contact or noncontact manner between a light source section 16 which is comprised of a rotating body rotating around wire-like material W as an axis and which irradiates an illuminating light orthogonal to the wire-like material, a rotating substrate 11 which comprises a light receiving sensor 17 arranged at a location where the illuminating light and a reflected light from the wire-like material are received at an angle θ of 90 degrees to 180 degrees in view of the cross section of the wire-like material, a supplying source of the illuminating light provided outside the system, and a data analyzing section which analyzes received light data by the light receiving sensor to convert it into a surface flaw, with respect to electric connection with the rotating substrate in an outside system apparatus.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于金属线状材料的缺陷检查设备和一种连续处理设备,其包括能够采用而不受目标电线材料的性质和类型的限制并且能够以低成本检查电线材料移动的检查装置。解决方案:提供用于金属线状材料的缺陷检查设备和使用该缺陷检查设备的连续处理设备,其中,通过以无接触或无接触方式使光源部分之间的电路形成电路。如图16所示,旋转基板11包括:以线状材料W为轴心旋转的旋转体,该旋转体照射与线状材料正交的照明光;以及旋转基板11,其具有配置在照明位置的受光传感器17。来自线状材料的光和反射光以角度θ被接收。鉴于线状材料的横截面,大于90度至小于180度的角度,设置在系统外部的照明光的供应源以及数据分析部分,该数据分析部分分析由光接收传感器接收的光数据以进行转换在与外部系统设备中与旋转基板的电连接方面,它会形成表面缺陷。;版权所有:(C)2010,JPO&INPIT

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