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METHOD FOR FORMING THIN FERROELECTRIC FILMS, ITS APPLICATION AND REMEMBERING DEVICE BASED ON FERROELECTRIC OLIGOMERIC REMEMBERING MATERIAL

机译:基于铁电低聚记忆材料的薄铁电薄膜的形成方法,应用及记忆装置

摘要

1. A method of forming thin ferroelectric films from an oligomer or co-oligomer of vinylidene fluoride (VDF), according to which the VDF oligomer or VDF co-oligomer with another oligomer is applied to a substrate to form a thin film thereon by evaporation carried out in a sealed chamber in which the substrate is enclosed and evaporator, characterized in that it includes the following operations:! a) the sealed chamber is pumped out to a pressure of less than 100 Pa,! b) cool the substrate to a temperature in the temperature range in which the main part of the oligomer or co-oligomer crystallizes into a polar crystalline phase oriented parallel to the substrate, but not lower than the temperature at which the pressure of saturated water vapor in the chamber becomes equal to the partial pressure of water vapor to the beginning of cooling, and not lower than -130 ° C,! c) the oligomer or co-oligomer is evaporated onto the substrate with the formation of a thin film of a given thickness,! d) after reaching a predetermined thickness with a thin film of oligomer or co-oligomer, the temperature of the substrate is raised to room temperature and! e) heating the deposited thin film of an oligomer or co-oligomer to a temperature in the range of 50-150 ° C. to anneal the deposited thin film to convert the residual non-polar crystalline phase to a polar crystalline phase. ! 2. The method according to claim 1, characterized in that they use an oligomer or co-oligomer of VDF containing less than 100 repeating units. ! 3. The method according to claim 1, characterized in that the source is used oligomer or co-oligomer VDF having a given length. ! 4. The method according to claim 1, characterized in that the original
机译:1.一种由偏二氟乙烯(VDF)的低聚物或共低聚物形成铁电薄膜的方法,根据该方法,将VDF低聚物或VDF共低聚物与另一种低聚物一起施涂到基材上,以通过蒸发在其上形成薄膜。在密闭基板和蒸发器的密闭室中进行,其特征在于包括以下操作: a)将密封腔室抽到小于100 Pa的压力! b)将基材冷却至该低聚物或共低聚物的主要部分结晶成平行于该基材取向的极性结晶相的温度范围内的温度,但不低于饱和水蒸气压力的温度在腔室内变得等于开始冷却的水蒸气的分压,并且不低于-130°C ,! c)将低聚物或共低聚物蒸发到基材上,形成给定厚度的薄膜! d)用低聚物或共低聚物的薄膜达到预定厚度后,将基材的温度升至室温并保持在室温。 e)将低聚物或共低聚物的沉积薄膜加热至50-150℃范围内的温度,以使沉积薄膜退火,以将残留的非极性结晶相转化为极性结晶相。 ! 2.根据权利要求1的方法,其特征在于它们使用包含少于100个重复单元的VDF的低聚物或共低聚物。 ! 3.根据权利要求1所述的方法,其特征在于,使用具有给定长度的低聚物或共聚VDF作为源。 ! 4.根据权利要求1所述的方法,其特征在于,原件

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