首页> 外国专利> IMPROVEMENT OF THE JOINT RELIABILITY BETWEEN SN-3.5AG SOLDER AND NI-P UNDER BUMP METALLIZATION BY CO ADDITION

IMPROVEMENT OF THE JOINT RELIABILITY BETWEEN SN-3.5AG SOLDER AND NI-P UNDER BUMP METALLIZATION BY CO ADDITION

机译:共添加凹凸金属化对提高SN-3.5AG焊料与Ni-P焊接可靠性的影响

摘要

A solder joint structure in which the junction reliability between Sn-3.5Ag solder and Ni-P under bump metallization by co addition is improved is provided to suppress the additional chemical reaction between the solid bottom metal layer and the liquid solder. A solder joint structure has a structure that the Ni-P bottom metal layer is welded into the Sn-3.5Ag-xCo alloy solder in which the cobalt is added. In the alloy solder, the cobalt includes to 0.02~0.1wt% range. The junction of the Ni-P bottom metal layer and the alloy solder(Sn-3.5Ag-xCo) adding the cobalt are connected between the PCB substrate and the silicon chip. The solder junction is connected between the silicon chip and silicon chip. The Ni3Sn4 is formed on the interface of the Ni-P metal layer and the Sn-3.5Ag alloy solder adding Co in order to improve the junction reliability.
机译:提供了一种焊点结构,其中通过共添加提高了凸点金属化下的Sn-3.5Ag焊料和Ni-P之间的连接可靠性,以抑制固态底部金属层和液态焊料之间的额外化学反应。焊点结构具有将Ni-P底部金属层焊接到其中添加了钴的Sn-3.5Ag-xCo合金焊料中的结构。在合金焊料中,钴的含量范围为0.02〜0.1wt%。 Ni-P底部金属层与添加了钴的合金焊料(Sn-3.5Ag-xCo)的结点连接在PCB基板和硅芯片之间。焊点连接在硅芯片和硅芯片之间。在Ni-P金属层和添加Co的Sn-3.5Ag合金焊料的界面上形成Ni3Sn4,以提高结可靠性。

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