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Method to detect poor infrared rays, Microchip that is able to detect poor infrared rays and apparatus working with these microchips
Method to detect poor infrared rays, Microchip that is able to detect poor infrared rays and apparatus working with these microchips
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机译：检测不良红外线的方法，能够检测不良红外线的Microchip以及使用这些微芯片的设备
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摘要
The invention relates to a method for the detection of poor rays of infrared wavelength, to a microchip that is able to detect poor infrared rays and to an apparatus working with these microchips.;The invention gives a possibility to detect and to locate little growings cancers and others hidden places of parts of a machine with increased temperature. The invention does do it with a special microchip which is able to change photons in electrons.;This microchip of the invention consists of a plate of glas or an other insulating material with a rough surface on the one side. The front surface of this plate is rough by a plurality of blind holes, the ground of each of theese blind holes is covered with a thin layer of metal, in each of the blind holes are located little crystals of a kind of material that emitts one or more electrons by each hit of an infrared light beam, the surface of this plate and the blind holes are covered with a net of very thin wires and the active part of this net of very thin wires has on its ends rails of metal to collect and transmit the electrons to a measuring instrument.
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