首页> 外国专利> SYSTEM AND METHOD FOR EFFECTING HIGH-POWER BEAM CONTROL WITH OUTGOING WAVEFRONT CORRECTION UTILIZING HOLOGRAPHIC SAMPLING AT PRIMARY MIRROR, PHASE CONJUGATION, AND ADAPTIVE OPTICS IN LOW POWER BEAM PATH

SYSTEM AND METHOD FOR EFFECTING HIGH-POWER BEAM CONTROL WITH OUTGOING WAVEFRONT CORRECTION UTILIZING HOLOGRAPHIC SAMPLING AT PRIMARY MIRROR, PHASE CONJUGATION, AND ADAPTIVE OPTICS IN LOW POWER BEAM PATH

机译:在低功率光束路径中利用全息成像在主镜上进行全息采样,相位共轭和自适应光学对输出光束进行校正以实现高功率光束控制的系统和方法

摘要

A beam control system and method. In an illustrative embodiment, the inventive system (500) provides a first beam of electromagnetic energy (503); samples the first beam (503) and provides a second beam (505) in response thereto; detects aberrations in the second beam (505); and corrects aberrations in the first beam (503) in response to the detected aberrations. In a specific implementation, the invention (500) includes a beam director telescope (510) having a primary mirror (516) on which a holographic optical element (518) is disposed. The holographic optical element (518) samples the output high-power beam and provides a sampled beam to a wavefront sensor (520). The wavefront sensor (520) provides signals to an adaptive optics processor (580). The adaptive optics processor (580) analyzes the sampled wavefront, detects aberrations therein and provides a correction signal to an optical phased array (550). A master oscillator (552) provides a reference beam, which reads the optical phased array (550) and is back reflected off a front surface of an aperture sharing element (540). The resulting beamfront is conjugated by a first phase conjugate mirror (546) and then again by a second phase conjugate mirror (556). The output of the second phase conjugate mirror (556) is amplified and reflected off the front surface of the aperture sharing element (540). The aperture sharing element (540) outputs the high power beam via the telescope (510) which is corrected for the optical distortions in the telescope and beam path.
机译:光束控制系统和方法。在一个说明性实施例中,本发明的系统(500)提供第一束电磁能(503);第二束电磁能(503)被提供。采样第一光束(503)并响应于此提供第二光束(505);检测第二光束中的像差(505);并响应于检测到的像差校正第一光束(503)中的像差。在特定的实施方式中,本发明(500)包括具有主镜(516)的光束导向器望远镜(510),在主镜上设置有全息光学元件(518)。全息光学元件(518)对输出的高功率光束进行采样,并将采样的光束提供给波前传感器(520)。波前传感器(520)将信号提供给自适应光学处理器(580)。自适应光学处理器(580)分析采样的波前,检测其中的像差,并将校正信号提供给光学相控阵(550)。主振荡器(552)提供参考光束,该参考光束读取光学相控阵列(550),并从孔径共享元件(540)的前表面反射回去。所得的光束前通过第一相位共轭镜(546)进行共轭,然后再次通过第二相位共轭镜(556)进行共轭。第二相位共轭镜(556)的输出被放大并反射离开孔径共享元件(540)的前表面。孔径共享元件(540)经由望远镜(510)输出高功率光束,该高功率光束针对望远镜和光束路径中的光学畸变被校正。

著录项

  • 公开/公告号IL156226B

    专利类型

  • 公开/公告日2008-11-26

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号IL156226

  • 发明设计人

    申请日2003-05-30

  • 分类号G02B26/06;G02B27/00;

  • 国家 IL

  • 入库时间 2022-08-21 19:27:51

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