首页>
外国专利>
Apparatus and method for test, characterization, and calibration of microprocessor-based and digital signal processor-based integrated circuit digital delay lines
Apparatus and method for test, characterization, and calibration of microprocessor-based and digital signal processor-based integrated circuit digital delay lines
展开▼
机译：用于测试，表征和校准基于微处理器和基于数字信号处理器的集成电路数字延迟线的装置和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A circuit board with a processing unit and a delay line with a controllable number of delay elements fabricated thereon includes apparatus for testing and calibrating the delay line elements. In the test mode, a calibrated pulse is delayed by the delay line while determining the logic state of pulse at two times, the interval between the two times being the same as the pulse width. By adding delay elements, the period of the calibrated pulse as a function of number of delay elements can determine the delay of each delay element. In the calibration mode, the delay line is configured as a ring oscillator and the frequency of the ring oscillator as a function of number of delay elements provides the time delay for the individual elements.
展开▼
