首页> 外国专利> CIRCUITS AND DESIGN STRUCTURES FOR MONITORING NBTI (NEGATIVE BIAS TEMPERATURE INSTABILITY) EFFECT AND/OR PBTI (POSITIVE BIAS TEMPERATURE INSTABILITY) EFFECT

CIRCUITS AND DESIGN STRUCTURES FOR MONITORING NBTI (NEGATIVE BIAS TEMPERATURE INSTABILITY) EFFECT AND/OR PBTI (POSITIVE BIAS TEMPERATURE INSTABILITY) EFFECT

机译:监视NBTI(负偏置温度不稳定性)效应和/或PBTI(正偏置温度不稳定性)效应的电路和设计结构

摘要

A ring oscillator has an odd number of NOR-gates greater than or equal to three, each with first and second input terminals, a voltage supply terminal, and an output terminal. The first input terminals of all the NOR-gates are interconnected, and each of the NOR-gates has its output terminal connected to the second input terminal of an immediately adjacent one of the NOR-gates. During a stress mode, a voltage supply and control block applies a stress enable signal to the interconnected first input terminals, and an increased supply voltage to the voltage supply terminals. During a measurement mode, this block grounds the interconnected first input terminals, and applies a normal supply voltage to the voltage supply terminals. Also included are an analogous NAND-gate based circuit, a circuit combining the NAND- and NOR-aspects, a circuit with a ring oscillator where the inverters may be coupled directly or through inverting paths, and circuits for measuring the bias temperature instability effect in pass gates.
机译:环形振荡器具有大于或等于三的奇数个“或非”门,每个门具有第一和第二输入端子,电压供应端子和输出端子。所有或非门的第一输入端子相互连接,并且每个或非门的输出端子连接至与或非门中紧邻的一个的第二输入端子。在压力模式期间,电压供应和控制块将压力使能信号施加到互连的第一输入端子,并将增加的供应电压施加到电压供应端子。在测量模式期间,此模块将互连的第一输入端子接地,并将正常的电源电压施加到电压电源端子。还包括类似的基于NAND门的电路,结合NAND和NOR方面的电路,带有环形振荡器的电路(其中的反相器可以直接耦合或通过反相路径耦合)以及用于测量偏置温度不稳定性影响的电路。通过大门。

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