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DIFFERENTIAL LINE EMI ANALYSIS SYSTEM, DIFFERENTIAL LINE EMI ANALYSIS METHOD, AND DIFFERENTIAL LINE EMI ANALYSIS PROGRAM

机译：差分线电磁干扰分析系统，差分线电磁干扰分析方法以及差分线电磁干扰分析程序

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摘要

PPROBLEM TO BE SOLVED: To predict EMI (Electro-Magnetic Interference) from a pair of a power plane and a ground plane depending on skew of a differential line and to determine the allowance value of the skew of the differential line satisfying an allowed EMI increase amount. PSOLUTION: This differential line EMI analysis system is provided with: a printed circuit board equivalent circuit generation part 105 which generates a printed circuit board equivalent circuit model; a circuit calculation part 108 which calculates voltage distribution of the pair of power plane and ground plane and current distribution of the differential line; an EMI increase amount calculation part 109a which calculates the increase amount of the EMI calculated from the printed circuit board equivalent circuit model when there is the skew in the differential line from a reference EMI calculated from the printed circuit board equivalent circuit model when there is no skew in the differential line; and a maximum allowed skew determination part 109a which determines the maximum allowed skew length to be the EMI increase amount less than the allowed EMI increase amount. PCOPYRIGHT: (C)2009,JPO&INPIT

机译：

要解决的问题：根据差分线的偏斜度从一对电源平面和接地平面预测EMI（电磁干扰），并确定满足以下条件的差分线偏斜度的允许值：允许EMI增加量。

解决方案：该差分线EMI分析系统具有：印刷电路板等效电路生成部105，其生成印刷电路板等效电路模型。电路计算部分108计算电源平面和接地平面对的电压分布以及差分线的电流分布; EMI增加量计算部分109a，当差分线中存在偏斜时，根据从印刷电路板等效电路模型计算出的参考EMI，计算从印刷电路板等效电路模型计算出的EMI的增长量。差分线偏斜;最大允许偏斜确定部109a将最大允许偏斜长度确定为小于允许EMI增加量的EMI增加量。

版权：（C）2009，日本特许厅＆INPIT 展开▼

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公开/公告号JP2009015678A

专利类型
公开/公告日2009-01-22

原文格式PDF
申请/专利权人 NEC CORP;
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申请/专利号JP20070178121
发明设计人 KOBAYASHI NAOKI;
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申请日2007-07-06
分类号G06F17/50;H05K3;
国家 JP
入库时间 2022-08-21 19:42:17

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