首页> 外国专利> The test data generation device, in the test data generation device which generates the test data which it conceals converts the storage null information data which stores the test data generation method

The test data generation device, in the test data generation device which generates the test data which it conceals converts the storage null information data which stores the test data generation method

机译:测试数据生成装置将生成隐藏的测试数据的测试数据生成装置转换为存储测试数据生成方法的存储空信息数据。

摘要

PROBLEM TO BE SOLVED: To generate test data to protect secret information by hiding data in use at actual operations, and to restore necessary items to verify the test data after the test. SOLUTION: The hiding method setting means which sets up hiding method according to items of the information data, the hiding information storing means which stores hiding information in terms of the items which the hiding method setting means set up its hiding method, the test data generation means which generates the test data by hiding the information data, the hiding/restoring specification means which makes restoration of the hidden items of the test data selectively specifiable, the restored information storing means which stores restoring information in terms of which the hiding/restoring specification means is specified to restore, and the data restoring means which restores specified items of the test data from the information of the items which are retained in prior to the hiding are provided.
机译:解决的问题:生成测试数据以通过隐藏实际操作中使用的数据来保护机密信息,并还原必要的项目以在测试后验证测试数据。解决方案:隐藏方法设置装置根据信息数据的项目设置隐藏方法,隐藏信息存储装置根据隐藏方法设置装置设置其隐藏方法的项目存储隐藏信息,测试数据生成通过隐藏信息数据来生成测试数据的装置,隐藏/恢复指定装置,其使得可以选择性地指定测试数据的隐藏项的恢复,恢复信息存储装置,其存储根据隐藏/恢复指定的恢复信息提供了一种指定用于恢复的装置,并且提供了一种数据恢复装置,该数据恢复装置从隐藏之前保留的项的信息中恢复测试数据的指定项。

著录项

  • 公开/公告号JP4344447B2

    专利类型

  • 公开/公告日2009-10-14

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP20000014937

  • 发明设计人 小林 隆志;宮崎 欣也;中野渡 透;

    申请日2000-01-24

  • 分类号G06F11/22;G06F21/24;

  • 国家 JP

  • 入库时间 2022-08-21 19:42:48

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