首页> 外国专利> Silicon on insulator type mixed micro-technological structure manufacturing method for e.g. sensor, involves removing sacrificial layer to expose surface of mixed layer, and forming covering layer on surface by direct bonding

Silicon on insulator type mixed micro-technological structure manufacturing method for e.g. sensor, involves removing sacrificial layer to expose surface of mixed layer, and forming covering layer on surface by direct bonding

机译:绝缘体上硅型混合微技术结构的制造方法,例如传感器,包括去除牺牲层以暴露混合层的表面,并通过直接粘合在表面上形成覆盖层

摘要

The method involves forming a temporary substrate having a mixed layer (15) adjacent to a sacrificial layer (2) and contact studs (1A, 1B) of different materials, where the sacrificial layer is made of nitride and stud (1B) is made of silicon dioxide. The sacrificial layer is removed to expose a mixed surface of the mixed layer, where the surface has portions of the studs. A continuous covering layer is formed on the surface by direct bonding, where the continuous layer and one of the studs contain different doping. A planarization layer made of polycrystalline is formed on the surface. An independent claim is also included for a mixed micro-technological structure comprising a support substrate.
机译:该方法包括形成临时基板,该临时基板具有与牺牲层(2)相邻的混合层(15)和不同材料的接触柱(1A,1B),其中,牺牲层由氮化物制成,柱(1B)由氮化物制成。二氧化硅。去除牺牲层以暴露混合层的混合表面,其中该表面具有部分螺柱。通过直接键合在表面上形成连续的覆盖层,其中连续层和柱钉之一包含不同的掺杂。在表面上形成由多晶制成的平坦化层。对于包括支撑衬底的混合微技术结构也包括独立权利要求。

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