首页> 外国专利> Structures i.e. honed structures, evaluation method, involves separating target characteristics and error characteristics for separation of target and error structures, and fragmenting original image into corrugated-and contact area image

Structures i.e. honed structures, evaluation method, involves separating target characteristics and error characteristics for separation of target and error structures, and fragmenting original image into corrugated-and contact area image

机译:结构,即磨光结构,评估方法,涉及分离目标特征和误差特征以分离目标和误差结构,并将原始图像分割成波纹和接触区域图像

摘要

The method involves separating target characteristics and error characteristics for separation of target and error structures. An original image is fragmented into a corrugated-and contact area image and a remaining image during the structures separation. The original image is obtained with the help of white light interferometry from optical three dimensional data. Measured three dimensional data or three dimensional image is processed, and original image relevant parameters are extracted.
机译:该方法包括分离目标特征和误差特征,以分离目标和误差结构。在结构分离期间,原始图像被分为瓦楞纸和接触区域图像以及其余图像。原始图像是借助白光干涉测量法从光学三维数据获得的。处理所测量的三维数据或三维图像,并提取原始图像相关参数。

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