首页> 外国专利> Sample`s i.e. group three nitride, reciprocal grid point measuring method, involves producing reflex at grid point by X-ray diffraction experiment, and performing another X-ray diffraction experiment at point under same angle of incidence

Sample`s i.e. group three nitride, reciprocal grid point measuring method, involves producing reflex at grid point by X-ray diffraction experiment, and performing another X-ray diffraction experiment at point under same angle of incidence

机译：样品即第三族氮化物的倒数网格点测量方法，涉及通过X射线衍射实验在网格点产生反射，并在相同入射角下在该点进行另一次X射线衍射实验

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摘要

The method involves producing a reflex is produced at a reciprocal grid point of a sample i.e. group three nitride, by using an arrangement in a X-ray diffraction experiment and recording the reflex with the help of a detector. Another X-ray diffraction experiment is performed at the same reciprocal grid point with an arrangement of x-ray tube and detector standing perpendicularly to the measurement under the same angle of incidence i.e. zero, and is recorded by using the latter detector. The X-ray tubes used in the measurements are selected to have either round or quadratic cross section.

机译：该方法包括通过在X射线衍射实验中使用布置并在检测器的帮助下记录反射，在样品的倒数栅格点即三族氮化物上产生反射。另一个X射线衍射实验是在相同的往复网格点上进行的，其中X射线管和检测器的布置垂直于测量，且入射角相同，即零，并使用后者检测器进行记录。测量中使用的X射线管的横截面选择为圆形或方形。

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公开/公告号DE102006038907A1

专利类型
公开/公告日2008-02-21

原文格式PDF
申请/专利权人 FORSCHUNGSZENTRUM JUELICH GMBH;
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申请/专利号DE20061038907
发明设计人 AHE MARTINA VON DER;
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申请日2006-08-18
分类号G01N23/20;
国家 DE
入库时间 2022-08-21 19:49:48

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